Technical Web Seminar from Keithley Teaches the Basics of Low Current Electrical Measurements

Cleveland, Ohio, 11 November 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, is hosting a free online seminar in which the company will explore the basics of electrical measurements from nA to fA .  The webcast, which will be broadcast on Thursday, 19 November, at 15:00 CET, is free to attend, but registration is required. For detailed seminar information and to register, visit http://www.keithley.info/low-current-webinar.
During the 45-minute seminar, Keithley nanotechnology expert Jonathan Tucker will discuss basic measurement issues including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise.
Aimed at students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and semiconductor device development, the seminar will also include some practical application examples and conclude with a discussion of recent innovative test equipment solutions.
Attendants of the live broadcast will have an opportunity to ask the presenter for additional insight during an interactive Q&A session.

Registration Information

“Electrical Measurements from nA to fA” will be broadcast on Thursday, November 19, at 15:00 CET. There is not charge to attend the event, but advance registration is required at http://www.keithley.info/low-current-webinar

About Keithley Instruments, Inc.

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.