Home / news / Keithley Offers Free CD of Nanotechnology Test Tutorials

Keithley Offers Free CD of Nanotechnology Test Tutorials

Document Actions
Cleveland, Ohio, July 13, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced its new Nanotechnology Technical Test Library on CD.

Editorial Contacts:
PRismaPR UK
Monika Cunnington
Phone: +44-1462-64 07 79
monika@prismapr.com
PRismaPR
Gabriele Amelunxen
Phone: +49-8106-24 72 33
info@prismapr.com

 



Keithley Offers Free CD of Nanotechnology Test Tutorials


Cleveland, Ohio, July 13, 2010    * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced its new Nanotechnology Technical Test Library on CD. The content of this free CD is helping to advance electrical measurements by providing technical papers, articles, data sheets, and links to online seminars covering a wide range of nanotechnology test applications. These applications include measurements that reveal important parameters of nanoscale semiconductor devices and materials, carbon nanotubes, Hall Effect devices, materials with non-linear resistance, and many others. Test and measurement solutions on the CD are organized by type of instrument: current sources, electrometers and picoammeters, integrated source/measure instruments, nanovoltmeters, parametric analyzers, and pulse/pattern generators.

 

For More Information

To request a free copy of the Nanotechnology Technical Test Library CD, visit http://www.keithley.info/nanocd


About Keithley Instruments, Inc.

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.


* * *







page updated: 2010-07-14