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Semiconductor Parametric Test and Device Characterization
Parametric testers, semiconductor parameter analyzers(SPA), semiconductor switches for semiconductor reliability, characterization, and parametric testing

Featured Products
Reliability Test
ACS Basic Edition
  • Optimized for component test, verification, and analysis applications
  • No coding needed - ACS’s intuitive GUI simplifies getting I-V tests, analysis, and results quickly
  • Hardware flexibility – Add or remove instruments dynamically to meet individual test needs
Parameter Analyzer
(I/V Curve Tracer)
Model 4200 Semiconductor Characterization System
  • Intuitive, point-and-click interface
  • Remote PreAmps offer 0.1fA resolution
  • Embedded PC
  • Project Navigator simplifies test control
Low Current Switching
Model 707A Switch Matrix
  • Integrates seamlessly with the Model 4200-SCS
  • 6-slot matrix controls up to 576 channels of 2-pole switching
  • Interactive one-touch
    programming

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Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF—From Modeling to Manufacturing
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