Skip to content
Sections
PRODUCTS & SERVICES SUPPORT KNOWLEDGE CENTER EVENTS COMPANY
Home / products / Semiconductor Parametric Test and Device Characterization

Model 4210-CVU 1kHz - 10MHz Capacitance Voltage Measurement Unit

Part Number: 4210-CVU

C-V measurements are as easy to perform as I-V measurements with the integrated C-V instrument. This optional capacitance-voltage instrument performs capacitance measurements from femtoFarads (fF) to nanoFards (nF) at frequencies from 1kHz to 10MHz. The C-V option includes a new power package that supports:

  • *High power C-V measurements up to 400V (200V per device terminal) for testing high power devices, such as MEMs, LDMOS devices, displays, etc.
  • *DC currents up to 300mA for measuring capacitance when a transistor is on.
The innovative design of the Model 4200-SCS has eight patents pending and is complemented by the broadest C-V test and analysis library available in any commercial C-V measurement solution. It also supplies diagnostic tools that ensure the validity of your C-V test results.

With this system, you can configure linear or custom C-V and C-f sweeps with up to 4096 data points. In addition, through the open environment of the Model 4200-SCS, you can modify any of the included tests, such as:

  • *C-V, C-t, and C-f measurements and analysis of:
    • *New! Complete solar cell libraries, including DLCP
    • *High and low k structures
    • *MOSFETs
    • *BJTs
    • *Diodes
    • *III-V compound devices
    • *Carbon nanotube (CNT) devices
    • *Doping profiles, TOX, and carrier lifetime tests
    • *Junction, pin-to-pin, and interconnect capacitance measurements

The C-V instrument integrates directly into the Model 4200-SCS chassis. It can be purchased as an upgrade to existing systems or as an option for new systems.