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Semiconductor Parametric Analyzers
For parametric testing that maximizes the productivity of technicians and engineers in R&D, the Model 4200-SCS Semiconductor Characterization System combines lab-grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution in a fully integrated characterization system. Options include the Model 4210-CVU Capacitance-Voltage Unit, Model 4225-PMU Ultra-Fast I-V Module, Model 4220-PGU Pulse Generator Unit, and Model 4225-RPM Remote Amplifier/Switch. Keithley’s ACS Basic Edition software is optimized for component and discrete (packaged) semiconductor device testing.
Selector Guides
ACS Basic Edition
Model ACS Basic Edition Semiconductor Parametric Test Software for Component and Discrete Devices
  • Semiconductor component characterization
  • Failure analysis
  • Easily adapted to new technology applications
  • Library of hundreds of standard device tests
  • Supports full range of Keithley SourceMeter instruments and more
4200-SCS Semiconductor Parameter Analyzer
Model 4200-CVU Integrated C-V Option for the Model 4200-SCS
  • Intuitive Windows based user interface
  • Single instrument solution
  • I-V, C-V and pulse generation, and pulse I-V
  • Application libraries included for every technology
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CALL NUMBER
1-800-935-5595 (US Only)